Fabrication of Nano-Tips by Carbon Contamination in a Scanning Electron Microscope for Use in Scanning Probe Microscopy and Field Emission
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چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Microscopy Microanalysis Microstructures
سال: 1997
ISSN: 1154-2799
DOI: 10.1051/mmm:1997127